Recent studies have shown that the triple-phase contact line has critical effect on the contact angle hysteresis of surfaces.In this study,patterned surfaces with various surface structures of different area fractions were prepared by electron etching on a silicon wafer.The advancing angle,receding angle and hysteresis angle of these surfaces were measured.Our experimental results showed that while the geometry of microstructure and contact line have a minor effect on the advancing angle,they have a significant effect on the receding angle and thus the hysteresis angle.We have shown that the effect of microstructure and the contact line can be described by a quantitative parameter termed the triple-phase line ratio.The theoretical predictions were in good agreement with our experimental results.
