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国家自然科学基金(50274014)

作品数:14 被引量:121H指数:8
相关作者:曲选辉贾成厂叶斌何新波任淑彬更多>>
相关机构:北京科技大学更多>>
发文基金:国家自然科学基金国家重点基础研究发展计划更多>>
相关领域:一般工业技术金属学及工艺冶金工程化学工程更多>>

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14 条 记 录,以下是 1-10
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Rheologic behavior and PIM processing of WC-TiC-Co powder feedstock
2004年
An improved wax-based binder was developed for the powder injection molding (PIM) of WC-TiC-Co cemented carbides.The critical powder loading and the rheologic behavior of the feedstock were determined. It was found that the critical powder loading could achieve up to 62.5% (volume fraction) and the feedstock exhibited a pseudo-plastic flow behavior. The injection molding,debinding and sintering processes were studied. The dimension deviation of the sintered samples could be controlled in the range of ±0.2% with the optimized processing parameters and the mechanical properties were better than or equivalent to those of the same alloy made by conventional press-sintering process.
XuanhuiQuJianxiangGaoMingliQinChangmingLei
关键词:机械性质流变学
Interfacial reactions between Sn-2.5Ag-2.0Ni solder and electroless Ni(P) deposited on SiC_p/Al composites被引量:3
2010年
A novel Sn-2.5Ag-2.0Ni alloy was used for soldering SiCp/Al composites substrate deposited with electroless Ni(5%P) (mass fraction)and Ni(10%P)(mass fraction)layers.It is observed that variation of P contents in the electroless Ni(P)layer results in different types of microstructures of SnAgNi/Ni(P)solder joint.The morphology of Ni3Sn4 intermetallic compounds(IMCs)formed between the solder and Ni(10%P)layer is observed to be needle-like and this shape provides high speed diffusion channels for Ni to diffuse into solder that culminates in high growth rate of Ni3Sn4.The diffusion of Ni into solder furthermore results in the formation of Kirkendall voids at the interface of Ni(P)layer and SiCp/Al composites substrate.It is observed that solder reliability is degraded by the formation of Ni2SnP,P rich Ni layer and Kirkendall voids.The compact Ni3Sn4 IMC layer in Ni(5%P)solder joint prevents Ni element from diffusing into solder,resulting in a low growth rate of Ni3Sn4 layer.Meanwhile,the formation of Ni2SnP that significantly affects the reliability of solder joints is suppressed by the low P content Ni(5%P)layer.Thus,shear strength of Ni(5%P) solder joint is concluded to be higher than that of Ni(10%P)solder joint.Growth of Ni3Sn4 IMC layer and formation of crack are accounted to be the major sources of the failure of Ni(5%P)solder joint.
吴茂曲选辉何新波Rafi-ud-din任淑彬秦明礼
关键词:SN种族
SiCp/Al电子封装复合材料预成形坯的制备被引量:9
2004年
在本实验中将SiC颗粒与粘结剂混合,温压制备成坯块,进行了热脱脂与预烧结,研究了热脱脂一预烧结后坯块的线性膨胀率、孔隙度、强度与工艺条件的关系,对预成形坯的显微组织形貌进行分析.结果表明,通过有效地控制成形、脱脂与烧结等工艺参数,能制备出具有适合强度和孔隙度的预成形坯.
平延磊贾成厂曲选辉李志刚
关键词:SICP/AL复合材料孔隙度
电子封装用高体积分数SiCp/Al复合材料的制备被引量:17
2006年
采用粉末注射成形制备SiC预成形坯和Al合金无压熔渗相结合的工艺,用单一粒度的粉末成功地制备出了致密度为98.7%的60%SiCp/Al高体积分数复合材料.SEM分析表明,所制备的复合材料增强体和基体分布均匀,组织致密,热膨胀系数在100℃到400℃范围内介于(7.10- 7.75)×10-6K-1之间,室温热导率为170W·m-1·K-1,能够完全满足电子封装的技术要求.
任淑彬何新波曲选辉叶斌
关键词:SICP/AL复合材料电子封装注射成形无压熔渗
高体积分数SiC_P/Al复合材料电子封装盒体的制备被引量:21
2006年
采用注射成型方法制备了SiCP封装盒体的预成型坯,用压力浸渗方法将熔融铝浸渗到SiCP封装盒体的预成型坯中,制备出含SiCP体积分数为65%的SiCP/Al复合材料的封装盒体。SEM观察表明,经过压力浸渗后SiCP/Al复合材料组织均匀且致密化高,室温热膨胀系数为8.0×10-6/K,热导率接近130 W/(m.K),密度为2.98 g/cm3,能够很好地满足电子封装的要求。
褚克贾成厂尹法章梅雪珍曲选辉
关键词:SICP/AL复合材料脱脂注射成型
Electronic packaging materials prepared by powder injecting molding and pressure infiltration process
2007年
AlSiCp (65 vol.% SiC) electronic packaging materials were manufactured by powder injection molding (PIM) and pressure infiltration process in order to obtain near net-shaped parts. SiCp preformed compacts obtained by pre-sintering process at 1150 K have high strength and good appearance, and the ratio of open porosity to total porosity is nearly 98%. The relative density of composites is bigger than 99%. The thermal conductivity of AlSiCp composites fabricated by this method is 198 Wm1K1, and the coefficient of thermal expansion (CTE) is 8.0 × 106/K (298 K).
YIN FazhangGUO HongJIA ChengchangXU JunZHANG XiminZHU Xuexin
关键词:微机构
Preparation,crystallization,and wetting of ZnO-Al_2O_3-B_2O_3-SiO_2 glass-ceramics for sealing to Kovar被引量:4
2009年
A novel type of ZnO-Al2O3-B2O3-SiO2 glass-ceramics sealing to Kovar in electronic packaging was developed,whose thermal expansion coefficient and electrical resistance are 5.2×10-6/oC and over 1×1013 Ω·cm,respectively.The major crystalline phases in the glass-ceramic seals were ZnAl2O4,ZnB2O4,and NaSiAl2O4.The dielectric resistance of the glass-ceramic could be remarkably enhanced through the control of alkali metal ions into crystal lattices.It was found that crystallization happened first on the surface of the sample,leaving the amorphous phase in the inner,which made the glass suitable for sealing.The glass-ceramic showed better wetting on the Kovar surface,and sealing atmosphere and temperature had great effect on the wetting angle.Strong interfacial bonding was obtained,which was mainly attributed to the interfacial reaction between SiO2 and FeO or Fe3O4.
Mao Wu Xin-bo He Zhuo-shen Shen Xuan-hui Qu
关键词:硼硅玻璃电子陶瓷表面润湿
Al基钎料钎焊SiCp/Al复合材料的研究
由于缺乏合适的Al基中温钎料,SiCp/Al复合材料的应用受到了严重阻碍。本文制备了三种Al-Si-Cu焊料,研究发现,随着Cu含量的增加,焊料的熔点逐渐降低,但是焊料的硬度在Cu超过20wt.%后迅速增加。CuAl2金...
常玲玲何新波王维彭子榕吴茂曲选辉
关键词:SICP/AL复合材料钎焊金属间化合物
文献传递
Effect of powder mixing process on the microstructure and thermal conductivity of Al/diamond composites fabricated by spark plasma sintering被引量:17
2010年
Two powder mixing processes, mechanical mixing (MM) and mechanical alloying (MA), were used to prepare mixed Al/diamond powders, which were subsequently consolidated using spark plasma sintering (SPS) to produce bulk Al/diamond composites. The effects of the powder mixing process on the morphologies of the mixed powders, the microstructure and the thermal conductivity of the composites were investigated. The results show that the powder mixing process can significantly affect the microstructure and the thermal conductivity of the composites. Agglomerations of the particles occurred in mixed powders using MM for 30 min, which led to high pore content and weak interfacial bonding in the composites and resulted in low relative density and low thermal conductivity for the composites. Mixed powders of homogeneous distribution of diamond particles could be obtained using MA for 10 min and MM for 2 h. The composite prepared through MA indicated a high relative density but low thermal conductivity due to its defects, such as damaged particles, Fe impurity, and local interfacial debonding, which were mainly introduced in the MA process. In contrast, the composite made by MM for 2 h demonstrated high relative density and an excellent thermal conductivity of 325 W·m-1·K-1, owing to its having few defects and strong interfacial bonding.
CHU Ke, JIA Chengchang, LIANG Xuebing, and CHEN Hui School of Materials Science and Engineering, University of Science and Technology Beijing, Beijing 100083, China
关键词:放电等离子烧结金刚石复合片
注射成形制备SiCp/Al复合材料电子封装盒体的预成形坯被引量:6
2007年
对碳化硅陶瓷注射喂料进行流变性能分析后得到合适的注射喂料.通过注射工艺和后续的脱脂-预烧结工艺成功制备出压渗用SiCp封装盒体的预成形坯.结果表明:SiCp装载量为65%,粘结剂成分为70%PW(石蜡)+29%HPDE(高密度聚乙烯)+1%SA(硬脂酸)的喂料在较宽的剪切速率和温度范围内均具有良好的注射性能;在合适的注射参数下可以制得完整无缺陷的注射坯;采用溶剂脱脂与热脱脂两步脱脂工艺,可以成功脱除注射坯体中的粘结剂,在1150℃进行预烧结,制备出了具有良好外观形貌、足够强度以及适中连通孔隙的预成形坯,可以满足后续加压渗铝制备SiCp/Al复合材料的封装盒体实验的要求.
褚克贾成厂梁雪冰曲选辉
关键词:电子封装材料喂料注射成形
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