In situ high-pressure angle dispersive x-ray diffraction experiments using synchrotron radiation on Te nanoplates were carried out with a diamond anvil cell at room temperature. The results show that Te-Ⅰ with a trigonal structure transforms to triclinic Te-Ⅱ at about 4.9 GPa, Te-Ⅱ transforms to monoclinic Te-Ⅲ at about 8.0 GPa, Te-Ⅲ turns to rhombohedral Te-Ⅳ at about 23.8 GPa, and Te-Ⅳ changes to body centered cubic Te-Ⅴ at 27.6 GPa. The bulk moduli B0 of Te nanoplates are higher than those of Te bulk materials.
In situ angle dispersive synchrotron X-ray diffraction and Raman scattering measurements under pressure are em- ployed to study the structural evolution of Cu4Bi4S9 nanoribbons, which are fabricated by using a facile solvothermal method. Both experiments show that a structural phase transition occurs near 14.5 GPa, and there is a pressure-induced re- versible amorphization at about 25.6 GPa. The electrical transport property of a single Cu4Bi4S9 nanoribbon under different pressures is also investigated.
